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« April 20, 2010 - April 20, 2010 »
 
04 / 20
(all day)
Start: Apr 6 2010 - 00:00
End: Jun 25 2010 - 23:59

Activities
1) Workshop: April 6-9, 2010, Location: CSIC Madrid (Spain).
Invited speakers: P. Cartier (IHES), F. Casas (Castellon), E. Celledoni (Trondheim), F. Chapoton (CNRS), Ph. Chartier (Rennes), A. Iserles (Cambridge), B. Jakubczyk (Warsaw), M. Kawski (Arizona), S. Malham (Edinburgh),D. Manchon (CNRS), H. Munthe-Kaas (Bergen), A. Murua (San Sebastian), W. Respondek (Rouen), A. Sarychev (Florence), F. Silva-Leite (Coimbra), J. Unterberger (Nancy) and G. Vilmart (Lausanne).
2) School: April 12-16, Location Benasque, Huesca (Spain)

End: 00:00
Start: Apr 19 2010 - 00:00
End: Apr 20 2010 - 00:00

The workshop will cover topics such as:

- Measurement systems analysis;
- Conformance assessment;
- Standards for measurement uncertainty evaluation;
- Coordination of measuring systems and process control;
- Measurement assisted assembly.

The workshop will consist of:

- 30-minute invited sessions;
- 20-minute contributed sessions;
- Poster sessions.

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